Title :
Direct mapping of the vibration modes of piezoelectric devices using white beam stroboscopic topography at ESRF
Author :
Capelle, B. ; Détaint, J. ; Epelboin, Y.
Author_Institution :
CNRS, Paris VII Univ., France
Abstract :
A new topographic method permits a direct mapping of the amplitude of the vibration modes of piezoelectric devices using white beam stroboscopic topography. With this method it is possible to measure the amplitude of the vibration of a thickness shear mode at each point of an AT cut quartz resonator. The principle of this method is based on the use of stroboscopic section topography obtained with the white beam delivered by a third generation synchrotron source
Keywords :
X-ray topography; crystal resonators; synchrotron radiation; vibration measurement; vibrations; AT cut quartz resonator; direct mapping; image formation; piezoelectric devices; plano-convex resonator; stroboscopic section topography; thickness shear mode; third generation synchrotron source; vibration amplitude; vibration modes; white beam stroboscopic topography; Frequency; Optical films; Piezoelectric devices; Reflection;
Conference_Titel :
Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International
Conference_Location :
Kansas City, MO
Print_ISBN :
0-7803-5838-4
DOI :
10.1109/FREQ.2000.887395
