Title :
Analysis of the rutile-ring method of frequency-temperature compensation of a high-Q whispering gallery sapphire resonator
Author :
Tobar, Michael E. ; Hartnett, John G. ; Duchiron, Guillaume ; Cros, Dominique ; Ivanov, Eugene N. ; Blondy, Pierre ; Guillon, Pierre
Author_Institution :
Dept. of Phys., Western Australia Univ., Nedlands, WA, Australia
Abstract :
Rigorous analysis of the rutile-ring method of frequency-temperature compensating of a high-Q sapphire resonator has been presented. A high Q-factor of 30 million was obtained with an annulment temperature of 56 K mainly limited by dielectric loss. The condition to obtain a low spurious mode density, high-q resonance that has a low susceptibility to environmental effects was established. It is desirable to design the compensation in the regime dominated by an antiresonance effect due to the rutile rings
Keywords :
Q-factor; compensation; crystal resonators; dielectric losses; microwave oscillators; sapphire; titanium compounds; 12 GHz; 56 K; Al2O3; Q-factor; TiO2; annulment temperature; antiresonance effect; dielectric loss; environmental effects; frequency-temperature compensation; rutile-ring method; spurious mode density; whispering gallery sapphire resonator; Dielectrics; Finite element methods; Fluctuations; Microwave oscillators; Paramagnetic materials; Permittivity; Q factor; Resonant frequency; Stability; Temperature;
Conference_Titel :
Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International
Conference_Location :
Kansas City, MO
Print_ISBN :
0-7803-5838-4
DOI :
10.1109/FREQ.2000.887405
