DocumentCode :
2679178
Title :
FAST-SC: Fast Fault Simulation in Synchronous Sequential circuits
Author :
Becker, B. ; Krieger, R.
Author_Institution :
J. W. Goethe University
fYear :
1993
fDate :
3-6 Jan 1993
Firstpage :
128
Lastpage :
131
Keywords :
Acceleration; Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computational modeling; Computer science; Computer simulation; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1993. Proceedings. The Sixth International Conference on
ISSN :
1063-9667
Print_ISBN :
0-8186-3180-5
Type :
conf
DOI :
10.1109/ICVD.1993.669662
Filename :
669662
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2679178
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