DocumentCode
2679249
Title
Evaluation of two non-standard techniques for the phase noise characterization at microwave frequencies
Author
Llopis, O. ; Juraver, J.B. ; Regis, M. ; Chaubet, M. ; Graffeuil, J.
Author_Institution
Lab. d´´Autom. et d´´Anal. des Syst., CNRS, Toulouse, France
fYear
2000
fDate
2000
Firstpage
511
Lastpage
515
Abstract
Two different phase noise measurement techniques dedicated to the test of microwave free running oscillators are described and compared. The interest of an injection locking technique for the characterization of the close to carrier performance of low phase noise DROs is shown through different measurements examples on state-of-the-art DRO at C and X band
Keywords
circuit testing; electric noise measurement; microwave measurement; microwave oscillators; phase noise; active technique; close to carrier performance; injection locking technique; low phase noise DRO; microwave free running oscillators; microwave frequencies; nonstandard techniques; oscillator testing; passive technique; phase noise characterization; Bandwidth; Frequency measurement; Injection-locked oscillators; Measurement techniques; Microwave frequencies; Microwave oscillators; Microwave theory and techniques; Noise measurement; Phase noise; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International
Conference_Location
Kansas City, MO
ISSN
1075-6787
Print_ISBN
0-7803-5838-4
Type
conf
DOI
10.1109/FREQ.2000.887409
Filename
887409
Link To Document