Title :
Evaluation of two non-standard techniques for the phase noise characterization at microwave frequencies
Author :
Llopis, O. ; Juraver, J.B. ; Regis, M. ; Chaubet, M. ; Graffeuil, J.
Author_Institution :
Lab. d´´Autom. et d´´Anal. des Syst., CNRS, Toulouse, France
Abstract :
Two different phase noise measurement techniques dedicated to the test of microwave free running oscillators are described and compared. The interest of an injection locking technique for the characterization of the close to carrier performance of low phase noise DROs is shown through different measurements examples on state-of-the-art DRO at C and X band
Keywords :
circuit testing; electric noise measurement; microwave measurement; microwave oscillators; phase noise; active technique; close to carrier performance; injection locking technique; low phase noise DRO; microwave free running oscillators; microwave frequencies; nonstandard techniques; oscillator testing; passive technique; phase noise characterization; Bandwidth; Frequency measurement; Injection-locked oscillators; Measurement techniques; Microwave frequencies; Microwave oscillators; Microwave theory and techniques; Noise measurement; Phase noise; Testing;
Conference_Titel :
Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International
Conference_Location :
Kansas City, MO
Print_ISBN :
0-7803-5838-4
DOI :
10.1109/FREQ.2000.887409
