Title :
A Simulation-Based Test Generation Scheme Using Genetic Algorithms
Author :
Srinivas, M. ; Patnaik, L.M.
Author_Institution :
Indian Institute of Science
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Cost function; Electrical fault detection; Fault detection; Genetic algorithms; Optimization methods; Robustness; Search methods;
Conference_Titel :
VLSI Design, 1993. Proceedings. The Sixth International Conference on
Print_ISBN :
0-8186-3180-5
DOI :
10.1109/ICVD.1993.669663
