DocumentCode
2679385
Title
A Simulation-Based Test Generation Scheme Using Genetic Algorithms
Author
Srinivas, M. ; Patnaik, L.M.
Author_Institution
Indian Institute of Science
fYear
1993
fDate
3-6 Jan 1993
Firstpage
132
Lastpage
135
Keywords
Circuit faults; Circuit simulation; Circuit testing; Cost function; Electrical fault detection; Fault detection; Genetic algorithms; Optimization methods; Robustness; Search methods;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 1993. Proceedings. The Sixth International Conference on
ISSN
1063-9667
Print_ISBN
0-8186-3180-5
Type
conf
DOI
10.1109/ICVD.1993.669663
Filename
669663
Link To Document