• DocumentCode
    2679565
  • Title

    A high-stability laser-pumped Cs gas-cell frequency standard

  • Author

    Ohuchi, Y. ; Suga, H. ; Fujita, M. ; Suzuki, T. ; Uchino, M. ; Takahei, K. ; Tsuda, M. ; Saburi, Y.

  • Author_Institution
    Anritsu Corp., Kanagawa, Japan
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    651
  • Lastpage
    655
  • Abstract
    A laser-pumped Cs gas-cell type atomic frequency standard with small sensitivity to the light power and cell temperature was developed by using a Cs gas cell with precise adjustment of buffer gases. Since its light power shift coefficient of microwave frequency is nearly zero when the light frequency of the laser is at one of the saturated-absorption lines of Cs, this atomic frequency standard is a relatively simple system without an optical offset-lock system. The light frequency of the laser is stabilized in turnkey fashion. This atomic frequency standard has unique stability compared to various commercially available atomic frequency standards. It´s stability is between the hydrogen maser and passive atomic frequency standards such as conventional lamp-pumped Rb gas-cell type and Cs beam type with a magnetic state selector in a measured averaging time range, from 4 sec to 1×104 sec, reaching a flicker floor of 2.5×10 -14 at 1000 sec
  • Keywords
    atomic clocks; caesium; frequency standards; laser beam applications; laser frequency stability; sensitivity; 1000 s; 1000 sec; 4 sec to 1×104 sec; 4 to 1E4 s; Cs; Cs frequency standard; atomic frequency standard; buffer gases; flicker floor; laser diode; laser-pumped Cs gas-cell; light frequency; light power shift coefficient; microwave frequency; optical offset-lock system; saturated-absorption lines; sensitivity; turnkey; Atom lasers; Atomic clocks; Frequency; Gas lasers; Gases; Masers; Optical buffering; Power lasers; Stability; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International
  • Conference_Location
    Kansas City, MO
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-5838-4
  • Type

    conf

  • DOI
    10.1109/FREQ.2000.887430
  • Filename
    887430