DocumentCode :
2679591
Title :
Coverage of bridging faults by random testing in IDDQ test environment
Author :
Rajsuman, R. ; Penry, D.A.
Author_Institution :
Case Western Reserve University
fYear :
1993
fDate :
3-6 Jan. 1993
Firstpage :
136
Lastpage :
139
Keywords :
Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic testing; Power engineering and energy; Power engineering computing; Power supplies; Steady-state;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1993. Proceedings. The Sixth International Conference on
Conference_Location :
Bombay, India
ISSN :
1063-9667
Print_ISBN :
0-8186-3180-5
Type :
conf
DOI :
10.1109/ICVD.1993.669664
Filename :
669664
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2679591
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