DocumentCode
2679591
Title
Coverage of bridging faults by random testing in IDDQ test environment
Author
Rajsuman, R. ; Penry, D.A.
Author_Institution
Case Western Reserve University
fYear
1993
fDate
3-6 Jan. 1993
Firstpage
136
Lastpage
139
Keywords
Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic testing; Power engineering and energy; Power engineering computing; Power supplies; Steady-state;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 1993. Proceedings. The Sixth International Conference on
Conference_Location
Bombay, India
ISSN
1063-9667
Print_ISBN
0-8186-3180-5
Type
conf
DOI
10.1109/ICVD.1993.669664
Filename
669664
Link To Document