• DocumentCode
    2679591
  • Title

    Coverage of bridging faults by random testing in IDDQ test environment

  • Author

    Rajsuman, R. ; Penry, D.A.

  • Author_Institution
    Case Western Reserve University
  • fYear
    1993
  • fDate
    3-6 Jan. 1993
  • Firstpage
    136
  • Lastpage
    139
  • Keywords
    Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic testing; Power engineering and energy; Power engineering computing; Power supplies; Steady-state;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1993. Proceedings. The Sixth International Conference on
  • Conference_Location
    Bombay, India
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-3180-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1993.669664
  • Filename
    669664