Title :
Time integration procedures for a cyclic thermoviscoplasticity model for Pb-Sn solder applications
Author :
Fu, Chiayu ; McDowell, David ; Ume, Charles
Author_Institution :
George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
A semi-implicit time integration scheme has been developed for a cyclic thermoviscoplastic constitutive model with tensorial internal state variables for Pb-Sn solder, a common metallic constituent in electronic packaging applications. The procedure has been implemented numerically into the commercial finite element (FE) code ABAQUS (1995) by user-defined material subroutines. Several simulations are conducted to compare the numerical implementation to experiments including monotonic uniaxial tests at different temperatures, creep tests at four stress levels, and a test with two-step load-controlled cyclic loading for 62Sn36Pb2Ag solder. An explicit time integration scheme is used as well to compare with the semi-implicit scheme. The accuracy as well as the stability of the solutions are considered. Several suggestions are made for using the material constitutive model and the semi-implicit integration scheme for modeling solder connections. This work provides guidelines to implement user-defined material behavior into FE analyses to perform more sophisticated thermomechanical simulations for solder connections in electronic packaging applications
Keywords :
finite element analysis; integration; lead alloys; plasticity; soldering; tin alloys; ABAQUS finite element code; Pb-Sn; creep test; cyclic thermoviscoplastic constitutive model; electronic packaging; metallic constituent; solder connection; thermomechanical simulation; time integration; uniaxial test; Algorithms; Conducting materials; Creep; Electronics packaging; Finite element methods; Guidelines; Stability; Stress; Temperature; Testing;
Conference_Titel :
Electronic Components and Technology Conference, 1996. Proceedings., 46th
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-3286-5
DOI :
10.1109/ECTC.1996.517420