• DocumentCode
    2679650
  • Title

    Carbon nanotube imperfection-immune digital VLSI: Frequently asked questions updated

  • Author

    Wei, Hai ; Zhang, Jie ; Wei, Lan ; Patil, Nishant ; Lin, Albert ; Shulaker, Max M. ; Chen, Hong-Yu ; Wong, H. S Philip ; Mitra, Subhasish

  • Author_Institution
    Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
  • fYear
    2011
  • fDate
    7-10 Nov. 2011
  • Firstpage
    227
  • Lastpage
    230
  • Abstract
    Carbon Nanotube Field-Effect Transistors (CNFETs) are excellent candidates for designing highly energy-efficient future digital systems. However, carbon nanotubes (CNTs) are inherently highly subject to imperfections that pose major obstacles to robust CNFET digital VLSI. This paper summarizes commonly raised questions and concerns about CNFET technology through a series of frequently asked questions. The specific questions addressed in this paper are motivated by recent advances in the field since the publication of our earlier paper on frequently asked questions in the Proceedings of the 2009 Design Automation Conference.
  • Keywords
    VLSI; carbon nanotube field effect transistors; electronic design automation; 2009 Design Automation Conference; carbon nanotube imperfection-immune digital VLSI; energy-efficient future digital system; robust CNFET digital VLSI; CNTFETs; Carbon nanotubes; Integrated circuit modeling; Logic gates; Silicon; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design (ICCAD), 2011 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4577-1399-6
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2011.6105330
  • Filename
    6105330