Title :
Carbon nanotube imperfection-immune digital VLSI: Frequently asked questions updated
Author :
Wei, Hai ; Zhang, Jie ; Wei, Lan ; Patil, Nishant ; Lin, Albert ; Shulaker, Max M. ; Chen, Hong-Yu ; Wong, H. S Philip ; Mitra, Subhasish
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
Abstract :
Carbon Nanotube Field-Effect Transistors (CNFETs) are excellent candidates for designing highly energy-efficient future digital systems. However, carbon nanotubes (CNTs) are inherently highly subject to imperfections that pose major obstacles to robust CNFET digital VLSI. This paper summarizes commonly raised questions and concerns about CNFET technology through a series of frequently asked questions. The specific questions addressed in this paper are motivated by recent advances in the field since the publication of our earlier paper on frequently asked questions in the Proceedings of the 2009 Design Automation Conference.
Keywords :
VLSI; carbon nanotube field effect transistors; electronic design automation; 2009 Design Automation Conference; carbon nanotube imperfection-immune digital VLSI; energy-efficient future digital system; robust CNFET digital VLSI; CNTFETs; Carbon nanotubes; Integrated circuit modeling; Logic gates; Silicon; Very large scale integration;
Conference_Titel :
Computer-Aided Design (ICCAD), 2011 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4577-1399-6
Electronic_ISBN :
1092-3152
DOI :
10.1109/ICCAD.2011.6105330