DocumentCode
2679661
Title
Polarimetric optical tools and decompositions applied to SAR images
Author
Colin, Elise K.
Author_Institution
Chemin de la Huniere, Palaiseau
fYear
2007
fDate
23-28 July 2007
Firstpage
4191
Lastpage
4194
Abstract
Radar polarimetry aims to determine the scattering properties of a target or scatterer. For this purpose, the scattering matrix can be analyzed and represented in several ways using various techniques to extract information about the scattering mechanisms. Polarimetry and ellipsometry are techniques which both study the properties of the polarization of the scattered waves but traditionally refer to different wavelengths: optical wavelengths for ellipsometry, and high-frequencies radio waves for radar polarimetry. This paper deals with natural targets in the general bistatic case, for which the 16 parameters of the Mueller matrix are independent. We try to answer the following questions: how to deduce the radar polarimetric parameters from the optical measurements of a Mueller ellipsometer? What are the polarimetric parameters traditionally devoted to optical images, and in which extent is it possible to apply and interpret them in the case of SAR images?
Keywords
S-matrix theory; ellipsometry; radar imaging; radar polarimetry; remote sensing by radar; synthetic aperture radar; Mueller ellipsometer; Mueller matrix; SAR image; ellipsometry; optical images; optical measurement; polarimetric optical decomposition; polarimetric optical tools; radar polarimetry; scattering matrix; scattering properties; Data mining; Ellipsometry; Information analysis; Laser radar; Matrix decomposition; Optical polarization; Optical scattering; Radar imaging; Radar polarimetry; Radar scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium, 2007. IGARSS 2007. IEEE International
Conference_Location
Barcelona
Print_ISBN
978-1-4244-1211-2
Electronic_ISBN
978-1-4244-1212-9
Type
conf
DOI
10.1109/IGARSS.2007.4423774
Filename
4423774
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