DocumentCode :
2679797
Title :
Automatic Test Plan Generation for Analog Integrated Circuits - A Practical Approach
Author :
Naiknaware, Ravindranath ; Nandakumar, G.N. ; Arora, Rajeev ; Larkin, John
Author_Institution :
Texas Instruments (India) Pvt. Ltd.
fYear :
1993
fDate :
3-6 Jan 1993
Firstpage :
140
Lastpage :
143
Keywords :
Algorithm design and analysis; Analog integrated circuits; Automatic testing; Circuit faults; Circuit testing; Databases; Design automation; Digital integrated circuits; Integrated circuit testing; Signal generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1993. Proceedings. The Sixth International Conference on
ISSN :
1063-9667
Print_ISBN :
0-8186-3180-5
Type :
conf
DOI :
10.1109/ICVD.1993.669665
Filename :
669665
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2679797
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