Title :
Automatic Test Plan Generation for Analog Integrated Circuits - A Practical Approach
Author :
Naiknaware, Ravindranath ; Nandakumar, G.N. ; Arora, Rajeev ; Larkin, John
Author_Institution :
Texas Instruments (India) Pvt. Ltd.
Keywords :
Algorithm design and analysis; Analog integrated circuits; Automatic testing; Circuit faults; Circuit testing; Databases; Design automation; Digital integrated circuits; Integrated circuit testing; Signal generators;
Conference_Titel :
VLSI Design, 1993. Proceedings. The Sixth International Conference on
Print_ISBN :
0-8186-3180-5
DOI :
10.1109/ICVD.1993.669665