• DocumentCode
    2679797
  • Title

    Automatic Test Plan Generation for Analog Integrated Circuits - A Practical Approach

  • Author

    Naiknaware, Ravindranath ; Nandakumar, G.N. ; Arora, Rajeev ; Larkin, John

  • Author_Institution
    Texas Instruments (India) Pvt. Ltd.
  • fYear
    1993
  • fDate
    3-6 Jan 1993
  • Firstpage
    140
  • Lastpage
    143
  • Keywords
    Algorithm design and analysis; Analog integrated circuits; Automatic testing; Circuit faults; Circuit testing; Databases; Design automation; Digital integrated circuits; Integrated circuit testing; Signal generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1993. Proceedings. The Sixth International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-3180-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1993.669665
  • Filename
    669665
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2679797