Title :
The STeTSiMS STT-RAM simulation and modeling system
Author :
Smullen, Clinton W., IV ; Nigam, Anurag ; Gurumurthi, Sudhanva ; Stan, Mircea R.
Author_Institution :
Dept. of Comput. Sci., Univ. of Virginia, Charlottesville, VA, USA
Abstract :
There is growing interest in emerging non-volatile memory technologies such as Phase-Change Memory, Memristors, and Spin-Transfer Torque RAM (STT-RAM). STT-RAM, in particular, is experiencing rapid development that can be difficult for memory systems researchers to take advantage of. What is needed are techniques that enable designers to explore the potential of recent STT-RAM designs and adjust the performance without needing a detailed understanding of the physics. In this paper, we present the STeTSiMS STT-RAM Simulation and Modeling System to assist memory systems researchers. After providing background on the operation of STT-RAM magnetic tunnel junctions (MTJs), we demonstrate how to fit three different published MTJ models to our model and normalize their characteristics with respect to common metrics. The high-speed switching behavior of the designs is evaluated using macromagnetic simulations. We have also added a first-order model for STT-RAM memory arrays to the CACTI memory modeling tool, which we then use to evaluate the performance, energy consumption, and area for: (i) a high-performance cache, (ii) a high-capacity cache, and (iii) a high-density memory.
Keywords :
cache storage; magnetic tunnelling; memristors; phase change memories; CACTI memory modeling; STT-RAM memory arrays; STeTSiMS; energy consumption; high-capacity cache; high-density memory; high-performance cache; high-speed switching; macromagnetic simulations; magnetic tunnel junctions; memristors; nonvolatile memory; phase-change memory; spin-transfer torque RAM; Anisotropic magnetoresistance; Magnetic tunneling; Mathematical model; Random access memory; Switches; Torque; Tunneling magnetoresistance;
Conference_Titel :
Computer-Aided Design (ICCAD), 2011 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4577-1399-6
Electronic_ISBN :
1092-3152
DOI :
10.1109/ICCAD.2011.6105348