• DocumentCode
    2680121
  • Title

    Improving Land Surface Pixel Level Albedo Characterization Using Sub-Pixel Information Retrieved from Remote Sensing

  • Author

    Liu, Wenjun ; Hu, Baoxin ; Wang, Shusen

  • Author_Institution
    Dept. of Earth & Space Sci. & Eng., York Univ., Toronto, ON
  • Volume
    2
  • fYear
    2008
  • fDate
    7-11 July 2008
  • Abstract
    Surface albedo plays an important role in climate model simulations. Current climate models usually use simplified approaches to calculate albedo and can not take sub-grid heterogeneity into account. For heterogeneous land areas, retrieving large scale surface albedo by using current albedo characterization schemes can cause considerably spatial scaling bias. The scaling biases in the albedo estimation processes mainly result from overlooking sub-pixel variability of land surface characteristics and non-linear relationships between albedo and related parameters. The objective is to establish a new methodology to further reduce spatial scaling bias of surface albedo at coarse resolution. Contexture-based and texture-based methods were applied to remove spatial scaling bias. In addition, a new method, dealing with spatial variation of between and within land cover type, was proposed and applied. The results indicate that lumped albedo value can be considerably biased from the distributed albedo (about 20% on average). New proposed corrective algorithm is generally effective for heterogeneous boreal forest pixels.
  • Keywords
    albedo; atmospheric optics; atmospheric techniques; climatology; remote sensing; boreal forest; climate model simulations; land surface pixel level albedo; remote sensing; subpixel information; Context modeling; Information retrieval; Land surface; Large-scale systems; MODIS; Remote sensing; Solid modeling; Spatial resolution; Surface texture; Vegetation; Albedo; Remote sensing; Spatial scaling; Sub-pixel information;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4244-2807-6
  • Electronic_ISBN
    978-1-4244-2808-3
  • Type

    conf

  • DOI
    10.1109/IGARSS.2008.4779115
  • Filename
    4779115