Title :
Al reflow studies for deep-submicron structures : properties and microstructure
Author :
Webster, M.N. ; Dirks, A.G.
Author_Institution :
Philips Research Laboratories
Keywords :
Artificial intelligence; Electrical resistance measurement; Inorganic materials; Laboratories; Metallization; Microstructure; Rough surfaces; Surface roughness; Temperature; Tin;
Conference_Titel :
Materials for Advanced Metallization, 1997. MAM '97 Abstracts Booklet., European Workshop
Conference_Location :
Villard de Lans, France
DOI :
10.1109/MAM.1998.887519