DocumentCode :
268033
Title :
Characterisation and simulation of low temperature Si-Si direct bonding through velcro-like surfaces based on porous silicon
Author :
Keshavarzi, Shervin ; Mescheder, U. ; Reinecke, Holger
Author_Institution :
Inst. of Appl. Res. (IAF), Furtwangen Univ., Furtwangen, Germany
fYear :
2014
fDate :
26-30 Jan. 2014
Firstpage :
1119
Lastpage :
1122
Abstract :
Velcro-like (needle like) surfaces based on porous silicon can result in strong permanent bonding at room temperature with capability of multiple bonding and un-bonding similar to Velcro® principle. However, understanding of the interaction mechanisms between such surfaces is crucial for employing this type of bonding for wafer or chip bonding and IC packing applications. In this paper, a simple Si technology to create Velcro-like surfaces is described and characterized, and the interaction mechanisms between such surfaces are modelled based on Van der Waals force approach.
Keywords :
elemental semiconductors; porous semiconductors; silicon; IC packing applications; Si technology; Si-Si; Van der Waals force approach; Velcro-like surfaces; chip bonding; interaction mechanisms; low temperature Si-Si direct bonding; multiple bonding capability; needle like surfaces; porous silicon; strong permanent bonding; temperature 293 K to 298 K; Bonding; Force; Needles; Silicon; Substrates; Surface morphology; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2014 IEEE 27th International Conference on
Conference_Location :
San Francisco, CA
Type :
conf
DOI :
10.1109/MEMSYS.2014.6765842
Filename :
6765842
Link To Document :
بازگشت