• DocumentCode
    2680405
  • Title

    2011 TAU power grid simulation contest: Benchmark suite and results

  • Author

    Zhuo Li ; Balasubramanian, R. ; Liu, F. ; Nassif, S.

  • Author_Institution
    IBM Austin Res. Lab., Austin, TX, USA
  • fYear
    2011
  • fDate
    7-10 Nov. 2011
  • Firstpage
    478
  • Lastpage
    481
  • Abstract
    Benchmark suite is an immensely useful tool in performing research since it allows for rapid and clear comparison between different approaches to solving CAD problems. Technology scaling with decrease in supply voltage, increase in power density and frequency will continue to impose strong challenges in designing of robust power delivery networks. An accurate analysis of power delivery networks has become an absolute necessity. A critical issue in power grid analysis is the large size of the power grid network. At the 45-nm technology node, the typical size of the power grid network is in the range of hundreds of million nodes. In this paper, we review the TAU 2011 Power Grid Simulation Contest. This contest was held to seek new efficient methods for solving very large power grid networks. Accuracy, run-time and memory were used as metrics to evaluate the solutions and consequently, prizes were awarded to the top three teams. The benchmarks in [1] are expanded to include larger networks that were created from real industry designs. These are made public along with the score from various teams that participated in the contest. These new benchmarks would aid in furthering academic research to address the increasing demands in the analysis of very large power grid networks.
  • Keywords
    power grids; CAD problems; TAU power grid simulation contest; power delivery networks; power grid analysis; power grid network; Benchmark testing; Design automation; Educational institutions; Integrated circuit modeling; Mathematical model; Measurement; Power grids; Benchmarks; Power Grid Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design (ICCAD), 2011 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4577-1399-6
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2011.6105371
  • Filename
    6105371