• DocumentCode
    2680427
  • Title

    Combining MSCR detector and PCA-SIFT descriptor for scene recognition

  • Author

    Shi, Dong-Cheng ; Yan, Guo-Qing

  • Author_Institution
    Sch. of Comput. Sci. & Eng., Changchun Univ. of Technol., Changchun, China
  • Volume
    2
  • fYear
    2010
  • fDate
    27-29 March 2010
  • Firstpage
    136
  • Lastpage
    141
  • Abstract
    This paper introduces a novel scene recognition algorithm to perform reliable scene recognition. Firstly, to construct the maximally stable regions, we exploit the maximally stable color regions (MSCR) detector for improving the identification of stable regions. Secondly, each detected region is processed properly by using the method of mathematics morphology. Finally, the descriptor is computed by using the Principal Components Analysis (PCA) based scale invariant feature transform (SIFT) descriptors, with the detected MSCR regions as input. Our experiments demonstrate that this algorithm wins high recognition accuracy, is more robust to image deformations and is both significantly more accurate and much faster than the standard SIFT descriptor based algorithm. Also we compare our algorithm to the global appearance based method, and show through experiments in both indoor and outdoor environments that our approach performs better.
  • Keywords
    object recognition; principal component analysis; transforms; MSCR detector; PCA-SIFT descriptor; global appearance based method; image deformations; mathematics morphology; maximally stable color regions; principal components analysis; scale invariant feature transform; scene recognition algorithm; Computer science; Computer vision; Detectors; Image recognition; Layout; Lighting; Object recognition; Principal component analysis; Reliability engineering; Robustness; MSCR; PCA- SIFT; feature extraction; invariant feature; scene recognition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Computer Control (ICACC), 2010 2nd International Conference on
  • Conference_Location
    Shenyang
  • Print_ISBN
    978-1-4244-5845-5
  • Type

    conf

  • DOI
    10.1109/ICACC.2010.5487196
  • Filename
    5487196