Title :
Titanium monophosphide (TIP) layers as diffusion barriers
Author :
Leutenecker, R. ; Froschle, B. ; Ramm, P.
Author_Institution :
Fraunhofer-Institute for Solid State Technology
Keywords :
Circuit testing; Coatings; Hydrogen; Rapid thermal annealing; Rapid thermal processing; Solid state circuits; Sputtering; Temperature; Tin; Titanium;
Conference_Titel :
Materials for Advanced Metallization, 1997. MAM '97 Abstracts Booklet., European Workshop
Conference_Location :
Villard de Lans, France
DOI :
10.1109/MAM.1998.887537