DocumentCode :
2680505
Title :
PTrace: Derivative-free local tracing of bicriterial design tradeoffs
Author :
Singhee, Amith
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
fYear :
2011
fDate :
7-10 Nov. 2011
Firstpage :
498
Lastpage :
502
Abstract :
This paper presents a novel method, PTrace, to locally and uniformly trace convex bicriterial Pareto-optimal fronts for bicriterial optimization problems that, unlike existing methods, does not require derivatives of the objectives with respect to the design variables. The method computes a sequence of points along the front in a user-specified direction from a starting point, such that the points are roughly uniformly spaced as per a spacing constraint from the user. At each iteration, a local quadratic model of the front is used to estimate an appropriate weighted sum of objectives that, on optimization, will give the next point on the front. A single objective optimization on this weighted sum then generates the actual point, which is then used to build a new local model. The method uses convexity-based heuristics to improve on mildly sub-optimal results from the optimizer and reuses cached points to improve the optimization speed and quality. We test the method on a synthetic and a 6-T SRAM power-performance tradeoff test case to demonstrate its effectiveness.
Keywords :
Pareto optimisation; convex programming; iterative methods; 6-T SRAM power-performance tradeoff test case; PTrace method; bicriterial design tradeoff; bicriterial optimization problem; cached points; convex bicriterial Pareto-optimal front tracing; convexity-based heuristics; derivative-free local tracing; design variables; local quadratic model; optimization quality; optimization speed; single objective optimization; spacing constraint; weighted sum; Computational modeling; Convergence; Equations; Integrated circuit modeling; Mathematical model; Optimization; Random access memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design (ICCAD), 2011 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
ISSN :
1092-3152
Print_ISBN :
978-1-4577-1399-6
Electronic_ISBN :
1092-3152
Type :
conf
DOI :
10.1109/ICCAD.2011.6105375
Filename :
6105375
Link To Document :
بازگشت