• DocumentCode
    2680727
  • Title

    The change of electrical properties of the aluminum-porous silicon contact by thermal annealing

  • Author

    Zimin, S.P. ; Komarov, E.P.

  • Author_Institution
    Yaroslavl State University Sovetskaya
  • fYear
    1997
  • fDate
    16-19 March 1997
  • Firstpage
    161
  • Lastpage
    161
  • Keywords
    Annealing; Charge carriers; Contacts; Etching; Hydrogen; Impurities; Inorganic materials; Passivation; Plasma temperature; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Materials for Advanced Metallization, 1997. MAM '97 Abstracts Booklet., European Workshop
  • Conference_Location
    Villard de Lans, France
  • ISSN
    1266-0167
  • Type

    conf

  • DOI
    10.1109/MAM.1998.887556
  • Filename
    887556