Title :
High voltage VLF test equipment with sinusoidal waveform
Author_Institution :
High Voltage Inc., USA
Abstract :
The problems associated with testing field aged XLPE cable using HVDC are now well documented. AC test equipment for field tests at power frequency also presents problems. The equipment required for such tests is large, heavy and expensive even with resonant test sets. Equipment producing very low frequency (VLF) high voltage has been used to some extent in the past. Typically this equipment produced 0.1 Hz voltage having a variety of waveforms. Squarewaves, triangular waves, etc. have been available. Such nonstandard waveforms complicate efforts to correlate VLF techniques with the results of power frequency tests. This paper describes AC test equipment utilizing a new approach to high voltage VLF in the range of 0.02 to 0.1 Hz. The equipment generates a sinusoidal waveform directly, without the additional complexity, cost and weight of HV filters. This not only saves weight and reduces cost but also simplifies its use in diagnostic tests such as partial discharge detection and site location. The design concept and application of the equipment to both voltage withstand testing and partial discharge testing are discussed
Keywords :
XLPE insulation; high-voltage techniques; insulation testing; partial discharge measurement; power cable insulation; power cable testing; test equipment; waveform generators; 0.02 to 1 Hz; AC test equipment; HVDC; diagnostic tests; field aged XLPE cable; high voltage VLF test equipment; partial discharge detection; partial discharge location; partial discharge testing; power frequency; power frequency tests; resonant test sets; sinusoidal waveform; underground power distribution lines; very low frequency high voltage; voltage withstand testing; AC generators; Aging; Costs; Frequency; HVDC transmission; Partial discharges; Resonance; Test equipment; Testing; Voltage;
Conference_Titel :
Transmission and Distribution Conference, 1999 IEEE
Conference_Location :
New Orleans, LA
Print_ISBN :
0-7803-5515-6
DOI :
10.1109/TDC.1999.755305