Title :
The Calibration of a Universal Test Fixture
Author :
Pollard, R.D. ; Lane, R.Q.
fDate :
May 31 1983-June 3 1983
Abstract :
A broadband, universal transistor test fixture uses exchangeable inserts to accommodate most transistor types. The calibration of the fixture and its inserts by a reliable, accurate and easy to use scheme is described.
Keywords :
Calibration; Circuit testing; Connectors; Fixtures; Frequency; Microwave devices; Microwave measurements; Microwave transistors; Packaging; System testing;
Conference_Titel :
Microwave Symposium Digest, 1983 IEEE MTT-S International
Conference_Location :
Boston, MA, USA
DOI :
10.1109/MWSYM.1983.1130960
