DocumentCode :
2681084
Title :
CACTI-P: Architecture-level modeling for SRAM-based structures with advanced leakage reduction techniques
Author :
Li, Sheng ; Chen, Ke ; Ahn, Jung Ho ; Brockman, Jay B. ; Jouppi, Norman P.
fYear :
2011
fDate :
7-10 Nov. 2011
Firstpage :
694
Lastpage :
701
Abstract :
This paper introduces CACTI-P, the first architecture-level integrated power, area, and timing modeling framework for SRAM-based structures with advanced leakage power reduction techniques. CACTI-P supports modeling of major leakage power reduction approaches including power-gating, long channel devices, and Hi-k metal gate devices. Because it accounts for implementation overheads, CACTI-P enables in-depth study of architecture-level tradeoffs for advanced leakage power management schemes. We illustrate the potential applicability of CACTI-P in the design and analysis of leakage power reduction techniques of future manycore processors by applying nanosecond scale power-gating to different levels of cache for a 64 core multithreaded architecture at the 22nm technology. Combining results from CACTI-P and a performance simulator, we find that although nanosecond scale power-gating is a powerful way to minimize leakage power for all levels of caches, its severe impacts on processor performance and energy when being used for L1 data caches make nanosecond scale power-gating a better fit for caches closer to main memory.
Keywords :
SRAM chips; integrated circuit design; integrated circuit modelling; CACTI-P architecture-level modeling; L1 data caches; SRAM-based structures; advanced leakage power management schemes; advanced leakage reduction techniques; core multithreaded architecture; high-k metal gate devices; leakage power reduction approaches; long channel devices; manycore processors; nanosecond scale power-gating; size 22 nm; Integrated circuit modeling; Leakage current; Logic gates; Random access memory; Switching circuits; Timing; Transistors; Leakage power management; SRAM; cache; circuit modeling; manycore processor; power-gating;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design (ICCAD), 2011 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
ISSN :
1092-3152
Print_ISBN :
978-1-4577-1399-6
Electronic_ISBN :
1092-3152
Type :
conf
DOI :
10.1109/ICCAD.2011.6105405
Filename :
6105405
Link To Document :
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