• DocumentCode
    2681178
  • Title

    Three dimensional metallization for vertically integrated circuits

  • Author

    Bollmann, D. ; Braun, R. ; Buchner, R. ; Cao-Minh, U. ; Engelhardt, M. ; Errmann, G. ; Grabl, T. ; Hieber, K. ; Hübner, H. ; Kawala, G. ; Kleiner, M. ; Klumpp, A. ; Kühn, S. ; Landesberger, C. ; Lezec, H. ; Muth, W. ; Pamler, W. ; Popp, R. ; Renner, E. ;

  • Author_Institution
    Siemens AG Corporate Technology, Microelectronics
  • fYear
    1997
  • fDate
    16-19 March 1997
  • Firstpage
    94
  • Lastpage
    98
  • Keywords
    Copper; Europe; Fabrication; Inorganic materials; Integrated circuit metallization; Integrated circuit technology; Microelectronics; Solid state circuits; Wafer bonding; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Materials for Advanced Metallization, 1997. MAM '97 Abstracts Booklet., European Workshop
  • Conference_Location
    Villard de Lans, France
  • ISSN
    1266-0167
  • Type

    conf

  • DOI
    10.1109/MAM.1998.887612
  • Filename
    887612