Quantification of Optical Deflection by Laser-structured ZnO:Al

Author

Berner, M. ; SaÌˆmann, Marc ; Garamoun, A. ; Schubert, M.B.

Author_Institution

Inst. of Photovoltaics, Univ. of Stuttgart, Stuttgart, Germany

Volume

3

Issue

1

fYear

2013

fDate

Jan. 2013

Firstpage

590

Lastpage

592

Abstract

A novel camera-based measurement setup fully quantifies the transmitted radiation deflected by textured front electrodes for thin-film solar cells. The conventional measurement of angular intensity distribution only analyzes one polar plane. The new setup examines the optical scattering and/or diffraction over the complete hemisphere. The hemispheric intensity distribution of laser-structured ZnO:Al proves reduced specular transmission and, hence, improved light trapping.

Keywords

aluminium; electrodes; laser materials processing; light scattering; optical materials; solar cells; zinc compounds; ZnO:Al; angular intensity distribution measurement; camera-based measurement setup; diffraction; hemispheric intensity distribution; laser-structured ZnO:Al; light trapping; optical deflection; optical scattering; polar plane; specular transmission; textured front electrodes; thin film solar cells; transmitted radiation; Collimators; Laser beams; Lenses; Measurement by laser beam; Optical diffraction; Photovoltaic cells; Semiconductor device measurement; Angular intensity distribution (AID); hemispheric intensity distribution (HID); laser-structured ZnO:Al; optical characterization;

fLanguage

English

Journal_Title

Photovoltaics, IEEE Journal of

Publisher

ieee

ISSN

2156-3381

Type

jour

DOI

10.1109/JPHOTOV.2012.2208942

Filename

6269040