DocumentCode
268148
Title
Effect of the Mission Profile on the Reliability of a Power Converter Aimed at Photovoltaic Applications—A Case Study
Author
De LeoÌn-Aldaco, S.E. ; Calleja, H. ; Chan, F. ; JimeÌnez-Grajales, H.R.
Author_Institution
Nat. Center for R&D of Technol., Cuernavaca, Mexico
Volume
28
Issue
6
fYear
2013
fDate
Jun-13
Firstpage
2998
Lastpage
3007
Abstract
This paper presents the reliability analysis of a push-pull converter intended for connection to a 125-W photovoltaic (PV) panel. Four prototypes of the converter were built and tested, using transistors with different ratings. Failure rates were calculated using the MIL HDBK 217 and the IEC TR 62380 procedures. In the latter case, the prediction was performed taking into account an annual mission profile obtained from the intended installation site, in an area with desert climate temperatures. Failure rate results obtained with MIL HDBK 217 show small differences among the converters, the best performance obtained from the prototype with the lowest on-resistance. Results obtained with IEC TR 62380 indicate that thermal cycles have a significant effect in reliability performance, and should be considered carefully, because PV systems often see large temperature variations. With both procedures, the failure rate contributions from magnetic devices were higher than expected.
Keywords
circuit reliability; military equipment; military standards; photovoltaic power systems; power convertors; IEC TR 62380; MIL HDBK 217; mission profile; photovoltaic application; photovoltaic panel; power 125 W; power converter reliability; push-pull converter; temperature variation; thermal cycles; Integrated circuit reliability; Prototypes; Stress; Temperature; Temperature measurement; Transistors; Photovoltaic (PV) power systems; power conversion; reliability; reliability estimation;
fLanguage
English
Journal_Title
Power Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0885-8993
Type
jour
DOI
10.1109/TPEL.2012.2222673
Filename
6323041
Link To Document