DocumentCode :
268150
Title :
Optimization of the Asymmetric Intermediate Reflector Morphology for High Stabilized Efficiency Thin n-i-p Micromorph Solar Cells
Author :
Biron, R. ; Hänni, Simon ; Boccard, M. ; Pahud, C. ; Bugnon, G. ; Ding, L. ; Nicolay, S. ; Parascandolo, G. ; Meillaud, F. ; Despeisse, M. ; Haug, F. ; Ballif, C.
Author_Institution :
Photovoltaics & Thin Film Electron. Lab., Inst. of Microeng. (IMT), Neuchatel, Switzerland
Volume :
3
Issue :
1
fYear :
2013
fDate :
Jan. 2013
Firstpage :
41
Lastpage :
45
Abstract :
This paper focuses on our latest progress in n-i-p thin-micromorph solar-cell fabrication using textured back reflectors and asymmetric intermediate reflectors, both deposited by low-pressure chemical vapor deposition of zinc oxide. We then present microcrystalline bottom cells with high crystallinity, which yield excellent long wavelength response for relatively thin absorber thickness. In a 1.5-μm-thick μc-Si:H single-junction n-i-p solar cell, we thus obtain a short-circuit current density of 25.9 mA·cm-2, resulting in an initial cell efficiency of 9.1%. Subsequently, the roughness of the intermediate reflector layer is adapted for the growth of high-performance amorphous silicon (a-Si:H) top cells. Combining bottom cells with high current, an optimal intermediate reflector morphology and a 0.22-μm-thick a-Si:H top cell, we reach high initial open-circuit voltages of 1.45 V, and we obtain a stabilized cell with an efficiency of 11.1%, which is our best stable efficiency for n-i-p solar cells.
Keywords :
II-VI semiconductors; amorphous semiconductors; chemical vapour deposition; current density; elemental semiconductors; hydrogen; optical elements; semiconductor junctions; short-circuit currents; silicon; solar cells; surface roughness; wide band gap semiconductors; zinc compounds; ZnO-Si:H; asymmetric intermediate reflector morphology; cell efficiency; crystallinity; high stabilized efficiency thin n-i-p micromorph solar cell fabrication; low-pressure chemical vapor deposition; microcrystalline bottom cells; open-circuit voltages; short-circuit current density; size 0.22 mum; size 1.5 mum; textured back reflectors; Charge carrier processes; Glass; Morphology; Photovoltaic cells; Silicon; Substrates; Zinc oxide; Intermediate reflector; light trapping; tandem cells; thin-film silicon solar cells;
fLanguage :
English
Journal_Title :
Photovoltaics, IEEE Journal of
Publisher :
ieee
ISSN :
2156-3381
Type :
jour
DOI :
10.1109/JPHOTOV.2012.2219502
Filename :
6327321
Link To Document :
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