Title :
1990 Proceedings. International Conference on Wafer Scale Integration (Cat. No.90CH2814-2)
Abstract :
The following topics were dealt with: WSI devices; parallel architectures; WSI architecture; fault tolerance; defect tolerance; WSI design; WSI test strategies; and WSI support technology
Keywords :
VLSI; cellular arrays; fault tolerant computing; integrated circuit technology; integrated circuit testing; microprocessor chips; parallel architectures; redundancy; WSI architecture; WSI design; WSI devices; WSI support technology; WSI test strategies; defect tolerance; fault tolerance; parallel architectures;
Conference_Titel :
Wafer Scale Integration, 1990. Proceedings., [2nd] International Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-8186-9013-5
DOI :
10.1109/ICWSI.1990.63918
