Title :
Application of an NVNA-Based System and Load-Independent X-Parameters in Analytical Circuit Design Assisted by an Experimental Search Algorithm
Author :
Pelaez-Perez, A.M. ; Woodington, S. ; Fernandez-Barciela, M. ; Tasker, P.J. ; Alonso, JoseÌ I.
Author_Institution :
SSR Dept., Univ. Politec. de Madrid, Madrid, Spain
Abstract :
Recently, X -parameters have been introduced to model active device nonlinear behavior. In addition to providing a measurement-based tool to numerically predict nonlinear device behavior in computer-aided design, they can also provide the designer of nonlinear circuits an analytical design tool. Exploiting this design tool aspect, this work presents an application that combines the nonlinear vector network analyzer PNA-X and a passive tuner to extract a transistor load-independent X -parameter model, focused around targeted circuit impedances for optimal performance. Furthermore, an experimental search algorithm, based on X-parameters analytical computations and developed by Peláez-Pérez , has been used and experimentally validated in this paper, aimed to speed up the characterization and design process, minimizing the number of load-pull measurements necessary to provide an accurate transistor X-parameter model for use in analytical and/or numerical circuit design.
Keywords :
electric impedance; network synthesis; transistor circuits; NVNA based system; PNA-X; active device nonlinear behavior; analytical circuit design; circuit impedance; computer aided design; experimental search algorithm; measurement based tool; nonlinear circuits; nonlinear device behavior; nonlinear vector network analyzer; numerical circuit design; passive tuner; transistor load independent X parameter model; Circuit synthesis; Heterojunction bipolar transistors; Impedance; Load modeling; Numerical models; Power generation; $X$-parameters; Analytical design; load–pull; microwave measurements; nonlinear; nonlinear vector network analyzer (NVNA);
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2012.2226056