DocumentCode :
2682019
Title :
Recent Development Of Femtosecond Spectroscopy For The Study Of Ultrafast Processes
Author :
Kobayashi, Takehiko
Author_Institution :
University of Tokyo,
fYear :
1997
fDate :
14-18 July 1997
Firstpage :
108
Lastpage :
108
Keywords :
Frequency domain analysis; Interferometry; Materials science and technology; Optimized production technology; Polymers; Raman scattering; Sagnac interferometers; Spectroscopy; Stability; Ultrafast electronics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 1997. CLEO/Pacific Rim '97., Pacific Rim Conference on
Conference_Location :
Chiba, Japan
Print_ISBN :
0-7803-3889-8
Type :
conf
DOI :
10.1109/CLEOPR.1997.610557
Filename :
610557
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2682019
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