Title :
Studies of the degradation mechanisms in high power diode lasers
Author :
Guoguang, Lu ; Huang Yun ; Lei Zhifeng
Author_Institution :
Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., CEPREI, Guangzhou, China
Abstract :
The main failure mechanisms of high power diode lasers such as material defects, mirror damage and solder related failures as well as to methods which significantly suppress the occurrence of catastrophic failure and solder related failures are investigated in this paper. Meanwhile, in order to obtain the lifetime data of high power QCM cm-bar arrays, we have set up an automated diode array reliability experiment to examine the characteristics of high power QCW cm-bar arrays over time, and aging test results up to 2.0×109 shots at 25°C will be reported.
Keywords :
ageing; failure analysis; laser mirrors; point defects; quantum well lasers; reliability; semiconductor laser arrays; solders; aging test; automated diode array reliability; catastrophic failure; degradation mechanisms; failure mechanisms; high power QCM cm-bar arrays; high power diode lasers; lifetime data; material defects; mirror damage; solder related failures; temperature 25 degC; Aging; Degradation; Diode lasers; Heating; Materials; Mirrors; Reliability;
Conference_Titel :
Advanced Packaging Materials (APM), 2011 International Symposium on
Conference_Location :
Xiamen
Print_ISBN :
978-1-4673-0148-0
DOI :
10.1109/ISAPM.2011.6105676
