Studies of the degradation mechanisms in high power diode lasers

Author

Guoguang, Lu ; Huang Yun ; Lei Zhifeng

Author_Institution

Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., CEPREI, Guangzhou, China

fYear

2011

fDate

25-28 Oct. 2011

Firstpage

80

Lastpage

84

Abstract

The main failure mechanisms of high power diode lasers such as material defects, mirror damage and solder related failures as well as to methods which significantly suppress the occurrence of catastrophic failure and solder related failures are investigated in this paper. Meanwhile, in order to obtain the lifetime data of high power QCM cm-bar arrays, we have set up an automated diode array reliability experiment to examine the characteristics of high power QCW cm-bar arrays over time, and aging test results up to 2.0×10⁹ shots at 25°C will be reported.

Keywords

ageing; failure analysis; laser mirrors; point defects; quantum well lasers; reliability; semiconductor laser arrays; solders; aging test; automated diode array reliability; catastrophic failure; degradation mechanisms; failure mechanisms; high power QCM cm-bar arrays; high power diode lasers; lifetime data; material defects; mirror damage; solder related failures; temperature 25 degC; Aging; Degradation; Diode lasers; Heating; Materials; Mirrors; Reliability;

fLanguage

English

Publisher

ieee

Conference_Titel

Advanced Packaging Materials (APM), 2011 International Symposium on

Conference_Location

Xiamen

ISSN

1550-5723

Print_ISBN

978-1-4673-0148-0

Type

conf

DOI

10.1109/ISAPM.2011.6105676

Filename

6105676