Title :
Improved testing using failure cost and intensity profiles
Author :
Ntafos, Simeon ; Poceciun-Benson, Vladlena
Author_Institution :
Dept. of Comput. Sci., Texas Univ., Richardson, TX, USA
Abstract :
The cost of field failures is arguably a very important factor in judging the quality of software. It would be nice if field failure costs could be used before the software is released so as to improve its quality. We introduced the expected cost of field failures (Ntafos, 1997) as a measure of test effectiveness and demonstrated that significant benefits are possible even with rather crude cost and failure rate estimates. We discuss the main issues that arise in trying to reduce the cost of field failures through better test effort allocation. We introduce improved models and strategies and present analytical and experimental (simulation) evaluations
Keywords :
program testing; software cost estimation; software quality; software reliability; experimental evaluations; failure intensity profiles; field failure costs; program testing; software quality; software reliability; test effectiveness; Computer science; Costs; Electrical capacitance tomography; Frequency; Input variables; Radio access networks; Software reliability; Software testing; Time measurement;
Conference_Titel :
Application-Specific Systems and Software Engineering Technology, 2000. Proceedings. 3rd IEEE Symposium on
Conference_Location :
Richardson, TX
Print_ISBN :
0-7695-0559-7
DOI :
10.1109/ASSET.2000.888068