DocumentCode
2682636
Title
Implications of rail electrodynamics
Author
Rolader, G.E. ; Jamison, K.A.
fYear
1990
fDate
21-23 May 1990
Firstpage
117
Abstract
Summary form only given, as follows. A model was developed to investigate possible effects of rail electrodynamics on the performance of railguns. This model describes the oscillatory nature of the rail motion in response to the Lorentz force and the compressive restoration force of material which is behind the rails. In this model, the rails are found to oscillate with a frequency of β. The rail dynamic behaviour induces local electric fields. The effect of these electric fields on stationary particles (lab frame) and on particles moving at the velocity of the plasma/projectile system (projectile frame) was investigated. In the lab frame, rail dynamics induce local electric fields which have maxima periodically spaced behind the projectile at locations where βt P is an odd multiple of π where t p is the time since the projectile has passed a location of the rails. Consequently, if restrike occurs, it is likely to occur at locations where βt P is an odd multiple of π. When the projectile is accelerating, rail dynamics induce electric fields in the projectile frame which have maxima where βt P is an even multiple of π. As the projectile velocity increases, the locations of the peak voltages move farther behind the projectile, which can enhance armature separation. For the CHECMATE railgun, calculations indicate that the rail displacement in on the order of 2 mm, the rail velocity is on the order of 50 m/s, and the voltages induced in the projectile frame are on the order of 20-40 V
Keywords
electrodynamics; electromagnetic launchers; 2 mm; 20 to 40 V; 50 m/s; CHECMATE railgun; Lorentz force; armature separation; compressive restoration force; induced voltages; local electric fields; rail displacement; rail electrodynamics; rail velocity; railguns;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1990. IEEE Conference Record - Abstracts., 1990 IEEE International Conference on
Conference_Location
Oakland, CA, USA
Type
conf
DOI
10.1109/PLASMA.1990.110590
Filename
5725866
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