DocumentCode
2682680
Title
Analysis of the degradation of the static characteristics of aged discrete and monolitic components
Author
Marcos-Acevedo, Jorge ; Soto-Campos, Enrique ; Fernandez-Gomez, S.
Author_Institution
Dipt. De Tecnol. Electron., Univ. de Vigo, Vigo, Spain
fYear
2011
fDate
12-15 June 2011
Firstpage
235
Lastpage
241
Abstract
This paper characterizes and analyzes a sample of aged components and compares the results with their original specifications. Analysis of the data is expected to provide a better understanding of the aging process and possible failure mechanisms of electronic components. In this paper we analyze TTL integrated circuits and CMOS integrated circuits, resistors, capacitors, transistors and diodes.
Keywords
CMOS integrated circuits; ageing; capacitors; diodes; resistors; transistor-transistor logic; transistors; CMOS integrated circuits; TTL integrated circuits; ageing; capacitors; diodes; discrete monolitic components; electronic components; failure mechanisms; resistors; transistors; Capacitors; Current measurement; Life estimation; Logic gates; Resistors; Voltage measurement; Accelerated life testing; Electronic components aging; liability;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability, Maintainability and Safety (ICRMS), 2011 9th International Conference on
Conference_Location
Guiyang
Print_ISBN
978-1-61284-667-5
Type
conf
DOI
10.1109/ICRMS.2011.5979269
Filename
5979269
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