Title :
Analysis of the degradation of the static characteristics of aged discrete and monolitic components
Author :
Marcos-Acevedo, Jorge ; Soto-Campos, Enrique ; Fernandez-Gomez, S.
Author_Institution :
Dipt. De Tecnol. Electron., Univ. de Vigo, Vigo, Spain
Abstract :
This paper characterizes and analyzes a sample of aged components and compares the results with their original specifications. Analysis of the data is expected to provide a better understanding of the aging process and possible failure mechanisms of electronic components. In this paper we analyze TTL integrated circuits and CMOS integrated circuits, resistors, capacitors, transistors and diodes.
Keywords :
CMOS integrated circuits; ageing; capacitors; diodes; resistors; transistor-transistor logic; transistors; CMOS integrated circuits; TTL integrated circuits; ageing; capacitors; diodes; discrete monolitic components; electronic components; failure mechanisms; resistors; transistors; Capacitors; Current measurement; Life estimation; Logic gates; Resistors; Voltage measurement; Accelerated life testing; Electronic components aging; liability;
Conference_Titel :
Reliability, Maintainability and Safety (ICRMS), 2011 9th International Conference on
Conference_Location :
Guiyang
Print_ISBN :
978-1-61284-667-5
DOI :
10.1109/ICRMS.2011.5979269
