Title :
On the embedded vector RF measurements in frequency agile and reconfigurable front-ends
Author :
Kouki, A.B. ; Masri, I. ; Gagnon, F. ; Thibeault, C.
Author_Institution :
Dept. of Electr. Eng., Ecole de Technol. Super., Montréal, QC, Canada
Abstract :
Emerging intelligent and reconfigurable radiofrequency front-ends require the use of embedded vector measurements to ensure their proper tuning and operation at the frequency of choice. Alternative solutions for embedded vector measurements are briefly reviewed and a new wideband, non directional four-port reflectometer for vector reflection coefficient measurement is proposed. The four-port is based on two nondirectional low coupling RF samplers judiciously placed on a transmission line. The principle and the basic theory governing the 4-port operation are presented. Experimental measurements using the proposed reflectometer are compared to simulations as well as measurements using commercial vector network analyzers for a wide range of loads. Good agreement is obtained with an error not exceeding 0.8 dB6∠6°.
Keywords :
radiofrequency measurement; 4-port operation; embedded vector RF measurements; frequency agile front-ends; non directional four-port reflectometer; radio technologies; reconfigurable front-ends; vector reflection coefficient measurement; Chromium; Electric variables measurement; Electromagnetic spectrum; Frequency measurement; Integrated circuit measurements; MIMO; Phase measurement; Phased arrays; Radio frequency; Transmission line measurements;
Conference_Titel :
Design and Technology of Integrated Systems in Nanoscale Era (DTIS), 2010 5th International Conference on
Conference_Location :
Hammamet
Print_ISBN :
978-1-4244-6338-1
DOI :
10.1109/DTIS.2010.5487547