Optimum truncated sequential test of binomial distribution

Binomial distribution is very useful in wide fields. And the truncated sequential test theory for the simple null hypothesis vs simple alternative hypothesis is the basis in binomial distribution sequential analysis. In this paper we have defined precise definitions of truncated sequential test of binomial distribution, such as, optimum truncated sequential test, uniformly optimum truncated sequential test (UOTST), nature extended truncated sequential test (NETST) of fixed sample size test, and so on. We also present the sufficient conditions for UOTST, and a lot of relative properties of truncated sequential test. At the end of this paper, we compare the UOTST with IEC1123, sequential mesh test (SMT) methods of truncated sequential test, the results show that UOTST has made significant improvement relatively, and the UOTST presented here is feasible and reliable.