• DocumentCode
    2682888
  • Title

    A comparison of two board level mechanical tests-drop impact and vibration shock

  • Author

    Yang, Liu ; Fenglian, Sun ; Hongwu, Zhang ; Zhen, Zhou ; Yong, Qin

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Harbin Univ. Sci. & Tech, Harbin, China
  • fYear
    2011
  • fDate
    25-28 Oct. 2011
  • Firstpage
    199
  • Lastpage
    203
  • Abstract
    Accidentally drop induced board level intercom-nects break has become one of the most important failure modes for portable electronic products. Board level drop impact test is widely used to evaluate the mechanical shock reliability of electronic assembly interconnects. In this paper, PCB responses during drop impact and vibration shock are compared using strain measurements. The loading similarities and differences of two mechanical shock tests are analyzed. The possibility and limitation of using vibration method for evaluating drop impact reliability are discussed. Results show that vibration test could be a replacement or supplement for drop test for single mode dominating situation. Vibration shock could produce similar loading amplitude and frequency to that of drop impact by adjusting to appropriate vibration parameters,. Compared with drop tests, vibration test provide better repeatability, easier operability. However, loading similarities between two methods only appear at impact locations dominated by single mode. For the locations with different modes superimposition, vibration shock cannot produce desirable loading as drop impact.
  • Keywords
    dynamic testing; failure analysis; impact testing; printed circuit testing; vibrations; PCB responses; accidentally drop induced board level interconnects break; board level drop impact test; board level mechanical tests-drop impact; drop impact reliability; drop test; electronic assembly interconnects; failure modes; loading similarities; mechanical shock reliability; mechanical shock tests; portable electronic products; strain measurements; vibration method; vibration parameters; vibration shock; vibration test; Acceleration; Electric shock; Loading; Reliability; Strain; Strain measurement; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials (APM), 2011 International Symposium on
  • Conference_Location
    Xiamen
  • ISSN
    1550-5723
  • Print_ISBN
    978-1-4673-0148-0
  • Type

    conf

  • DOI
    10.1109/ISAPM.2011.6105699
  • Filename
    6105699