• DocumentCode
    2683022
  • Title

    A method of unsensitizable path identification using high level design information

  • Author

    Ohtake, Satoshi ; Ikeda, Naotsugu ; Inoue, Michiko ; Fujiwara, Hideo

  • Author_Institution
    Grad. Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Nara, Japan
  • fYear
    2010
  • fDate
    23-25 March 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper proposes a method of unsensitizable path identification. By dealing with untestable paths in sequential circuits at register-transfer level (RTL) and utilizing design information obtained from high-level synthesis, the method can identify sequentially unsensitizable paths effectively and efficiently. Information about identified unsensitizable paths can not only facilitate process of test generation but also mitigate futileness of testing. In this work, we employ non-robust unsensitizability, which is widely supported in current ATPG systems, for identifying unsensitizable paths. We show the effectiveness of use of high-level design information through our experiments using RTL circuits synthesized from behavioral benchmark circuits.
  • Keywords
    automatic test pattern generation; high level synthesis; integrated circuit testing; sequential circuits; ATPG system; RTL circuits; behavioral benchmark circuit; high-level design; high-level synthesis; nonrobust unsensitizability; register-transfer level; sequential circuit; test generation; unsensitizable path identification; untestable path; Circuit faults; Circuit synthesis; Circuit testing; Delay; Fault diagnosis; High level synthesis; Paper technology; Registers; Sequential circuits; Signal processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Technology of Integrated Systems in Nanoscale Era (DTIS), 2010 5th International Conference on
  • Conference_Location
    Hammamet
  • Print_ISBN
    978-1-4244-6338-1
  • Type

    conf

  • DOI
    10.1109/DTIS.2010.5487557
  • Filename
    5487557