Title :
Accelerated degradation data statistical model based on first passage time
Author :
Liu, Hecai ; Yang, Ling
Author_Institution :
Dept. of Math., Guiyang Univ., Guiyang, China
Abstract :
This paper discusses accelerated degradation failure problem of the electronic products, and puts forward the accelerated degradation data statistical model based on first passage time. Then the model with the computer simulation is verified.
Keywords :
electronic products; failure analysis; life testing; statistical analysis; accelerated degradation data statistical model; computer simulation; electronic products; failure problem; first passage time; Acceleration; Data models; Degradation; Fitting; Integrated circuit reliability; Stress; Arrhenius model; Computer simulation; First passage time; accelerated degradation data;
Conference_Titel :
Reliability, Maintainability and Safety (ICRMS), 2011 9th International Conference on
Conference_Location :
Guiyang
Print_ISBN :
978-1-61284-667-5
DOI :
10.1109/ICRMS.2011.5979294
