• DocumentCode
    2683181
  • Title

    Accelerated degradation data statistical model based on first passage time

  • Author

    Liu, Hecai ; Yang, Ling

  • Author_Institution
    Dept. of Math., Guiyang Univ., Guiyang, China
  • fYear
    2011
  • fDate
    12-15 June 2011
  • Firstpage
    369
  • Lastpage
    371
  • Abstract
    This paper discusses accelerated degradation failure problem of the electronic products, and puts forward the accelerated degradation data statistical model based on first passage time. Then the model with the computer simulation is verified.
  • Keywords
    electronic products; failure analysis; life testing; statistical analysis; accelerated degradation data statistical model; computer simulation; electronic products; failure problem; first passage time; Acceleration; Data models; Degradation; Fitting; Integrated circuit reliability; Stress; Arrhenius model; Computer simulation; First passage time; accelerated degradation data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability, Maintainability and Safety (ICRMS), 2011 9th International Conference on
  • Conference_Location
    Guiyang
  • Print_ISBN
    978-1-61284-667-5
  • Type

    conf

  • DOI
    10.1109/ICRMS.2011.5979294
  • Filename
    5979294
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2683181