Title :
Measurement and simulation of simultaneous switching noise in the multi-reference plane package
Author :
Rosser, Steven G. ; Kerr, Michael K. ; Chang, Chi Shih ; Fang, Jiayuan ; Chen, Zhaoqing ; Chen, Yuzhe
Author_Institution :
IBM Microelectron., USA
Abstract :
A simplified laboratory experiment representing simultaneously switching circuits in a multi-reference plane package is described. Experimental data is compared to theoretical calculations and to simulated data from three modeling techniques of progressive complexity, including lumped element, hybrid lumped element/transmission line, and full wave solutions. The merits and limitations of each technique are presented
Keywords :
integrated circuit noise; integrated circuit packaging; full wave model; hybrid lumped element/transmission line model; lumped element model; multi-reference plane package; simulation; simultaneous switching noise; Circuit noise; Circuit simulation; Digital integrated circuits; Laboratories; Noise generators; Noise measurement; Noise shaping; Packaging; Switching circuits; Wiring;
Conference_Titel :
Electronic Components and Technology Conference, 1996. Proceedings., 46th
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-3286-5
DOI :
10.1109/ECTC.1996.517456
