DocumentCode :
2683418
Title :
Annealing effect and crystallization characteristics of copper wire bonding on pre-plated leadframe
Author :
An, Bing ; Ding, Lan ; Wang, Techun ; Lu, Tailieh ; Wu, Yiping
Author_Institution :
ASE Assembly & Test Shanghai Ltd., Shanghai, China
fYear :
2011
fDate :
25-28 Oct. 2011
Firstpage :
141
Lastpage :
144
Abstract :
Copper wire bonding on pre-plated leadframe (PPF) is an ever-increasing mode of interconnection in electronic packaging to substitute the gold wire bonding in the volume production in the forthcoming years. Reliability from copper wire bonding should however be well known before putting the process into manufacturing. In this letter, the 4N copper wire with 50 μm diameter bonded on PPF substrate was investigated. It was found for some samples that due to the work hardening effect of the copper, low bonding strength in the heel of the 2nd bond between the copper wire and the PPF surface was noticeable. An anneal process was introduced to recover the microstructural weakness, and wire pull tests revealed that it remarkably enhanced the bond strength of the 2nd joint. Interfacial crystallization characteristics have shown the difference between the 1st and the 2nd bonds which were attributed to hot forming and cold forming respectively.
Keywords :
annealing; copper; electronics packaging; lead bonding; reliability; Cu; annealing effect; bond strength; cold forming; electronic packaging; hot forming; interfacial crystallization characteristics; microstructural weakness; preplated leadframe substrate; size 50 mum; volume production; wire bonding; wire pull tests; work hardening effect; Annealing; Bonding; Copper; Gold; Reliability; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Packaging Materials (APM), 2011 International Symposium on
Conference_Location :
Xiamen
ISSN :
1550-5723
Print_ISBN :
978-1-4673-0148-0
Type :
conf
DOI :
10.1109/ISAPM.2011.6105727
Filename :
6105727
Link To Document :
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