Title :
An Improved Model for Short- and Open-Circuited Series Stubs in Fin Lines
Author :
Burton, M. ; Hoefer, W.J.R.
fDate :
May 30 1984-June 1 1984
Abstract :
This paper presents empirical closed-form expressions for the scattering parameters of series stubs in single-ridge, unilateral fin line with narrow gap width. These expressions show the effect of fin gap width, stub length, and frequency and are suitable for computer-aided design.
Keywords :
Connectors; Design automation; Distributed parameter circuits; Equivalent circuits; Frequency; Scattering parameters; Testing; Thickness measurement; Transmission line discontinuities; Transmission line measurements;
Conference_Titel :
Microwave Symposium Digest, 1984 IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/MWSYM.1984.1131781
