DocumentCode :
2683935
Title :
Investigation of the structural changes in LDPE and XLPE induced by high electrical stress
Author :
Sayers, P.W. ; Lewis, T.J. ; Llewellyn, J.P. ; Griffiths, C.L.
Author_Institution :
Univ. of Wales, Bangor, UK
fYear :
2000
fDate :
2000
Firstpage :
403
Lastpage :
407
Abstract :
It is shown that the application of high electrical fields at power frequency causes dramatic changes in the spectra of LDPE and XLPE polymers. The field creates intense Raman-induced photoluminescence but this decays with time, the characteristic polyethylene Raman spectrum is suppressed and new Raman lines appear. One of these lines indicates that unsaturated C=C bonds are being generated. There is also evidence from scanning probe microscopy that the field destroys the lamella structure and can create 10 nm wide cracks. It is suggested that the high electrical fields create mechanical forces that gradually destroy the crystalline lamella structure of polyethylene by polymer chain disentanglement, the molecule scissions and free radical production. The outcome is a void network or craze conducive to tree propagation
Keywords :
Raman spectra; XLPE insulation; high field effects; photoluminescence; polyethylene insulation; polymer structure; scanning probe microscopy; solid-state phase transformations; LDPE; XLPE; cracks; craze; free radical production; high electrical stress; intense Raman-induced photoluminescence; lamella structure; molecule scissions; polyethylene Raman spectrum; polymer chain disentanglement; power frequency; scanning probe microscopy; structural changes; tree propagation; unsaturated C=C bonds; void network;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Dielectric Materials, Measurements and Applications, 2000. Eighth International Conference on (IEE Conf. Publ. No. 473)
Conference_Location :
Edinburgh
Print_ISBN :
0-85296-730-6
Type :
conf
DOI :
10.1049/cp:20000541
Filename :
888150
Link To Document :
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