DocumentCode :
2683975
Title :
Verification of SystemC transaction level models using an aspect-oriented and generic approach
Author :
Kallel, Moez ; Lahbib, Younes ; Tourki, Rached ; Baganne, Adel
Author_Institution :
Electron. & Micro-Electron. Lab., Fac. of Sci. of Monastir, Monastir, Tunisia
fYear :
2010
fDate :
23-25 March 2010
Firstpage :
1
Lastpage :
6
Abstract :
Transaction level modeling (TLM) has become an accepted and well supported paradigm that is intended to create hardware designs at high abstraction levels. In this paper, we present a methodology that targets the verification of SystemC transaction level models using runtime monitoring. Aspect-oriented programming (AOP) techniques are exploited to handle the high-level TLM features in an automated and generic way. No modifications are needed in the design´s SystemC code. In addition, a wide range of functional and performance assertions is addressed. We demonstrate the usefulness of our approach on a realistic system-on-chip platform based on TLM-2.0 standard compliant models and including Open Core Protocol (OCP) interfaces.
Keywords :
aspect-oriented programming; protocols; system-on-chip; transmission line matrix methods; SystemC transaction level; TLM-2.0 standard compliant; aspect-oriented programming techniques; generic approach; high-level TLM features; open core protocol interfaces; system-on-chip a platform; transaction level modeling; Analytical models; Automatic programming; Hardware; Laboratories; Libraries; Logic design; Monitoring; Protocols; Runtime; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Technology of Integrated Systems in Nanoscale Era (DTIS), 2010 5th International Conference on
Conference_Location :
Hammamet
Print_ISBN :
978-1-4244-6338-1
Type :
conf
DOI :
10.1109/DTIS.2010.5487605
Filename :
5487605
Link To Document :
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