Title : 
Verification of SystemC transaction level models using an aspect-oriented and generic approach
         
        
            Author : 
Kallel, Moez ; Lahbib, Younes ; Tourki, Rached ; Baganne, Adel
         
        
            Author_Institution : 
Electron. & Micro-Electron. Lab., Fac. of Sci. of Monastir, Monastir, Tunisia
         
        
        
        
        
        
            Abstract : 
Transaction level modeling (TLM) has become an accepted and well supported paradigm that is intended to create hardware designs at high abstraction levels. In this paper, we present a methodology that targets the verification of SystemC transaction level models using runtime monitoring. Aspect-oriented programming (AOP) techniques are exploited to handle the high-level TLM features in an automated and generic way. No modifications are needed in the design´s SystemC code. In addition, a wide range of functional and performance assertions is addressed. We demonstrate the usefulness of our approach on a realistic system-on-chip platform based on TLM-2.0 standard compliant models and including Open Core Protocol (OCP) interfaces.
         
        
            Keywords : 
aspect-oriented programming; protocols; system-on-chip; transmission line matrix methods; SystemC transaction level; TLM-2.0 standard compliant; aspect-oriented programming techniques; generic approach; high-level TLM features; open core protocol interfaces; system-on-chip a platform; transaction level modeling; Analytical models; Automatic programming; Hardware; Laboratories; Libraries; Logic design; Monitoring; Protocols; Runtime; System-on-a-chip;
         
        
        
        
            Conference_Titel : 
Design and Technology of Integrated Systems in Nanoscale Era (DTIS), 2010 5th International Conference on
         
        
            Conference_Location : 
Hammamet
         
        
            Print_ISBN : 
978-1-4244-6338-1
         
        
        
            DOI : 
10.1109/DTIS.2010.5487605