DocumentCode :
2684133
Title :
Growth of ZnO epitaxial films by metal organic chemical vapor deposition at various temperatures
Author :
Zhang, B.P. ; Wakatsuki, K. ; Binh, N.T. ; Usami, N. ; Segawa, Y.
Author_Institution :
Photodynamics Res. Center, Inst. of Phys. & Chem. Res., Sendai, Japan
Volume :
2
fYear :
2003
fDate :
15-19 Dec. 2003
Abstract :
ZnO epitaxial films are grown on sapphire (0001) substrates by metal organic chemical vapor deposition (MOCVD) at temperatures from 200 to 500 °C. The half width (FWHM) of rocking curves from these films is greatly improved with increasing the growth temperature, Tg, with a sudden decrease at about Tg= 300 °C. The in-plane orientation of ZnO unit cells changes with temperature: no-twist for Tg = 200 °C and 30 °twist for Tg ≥300 °C with respect to the unit cell of the substrate. The surface morphology is strongly dependent on growth temperature, with smooth surfaces at low Tg. The emission spectra from the ZnO films are dominated by bound exciton transitions and better emission properties are obtained for Tg > 375 °C. Acceptor-related emissions were observed from ZnO films grown at Tg < 300 °C, indicating the importance of growth at low temperatures in future applications of ZnO-related oxides.
Keywords :
II-VI semiconductors; MOCVD; X-ray diffraction; crystal orientation; excitons; photoluminescence; semiconductor epitaxial layers; semiconductor growth; surface morphology; wide band gap semiconductors; zinc compounds; 200 to 500 degC; Al2O3; ZnO; ZnO epitaxial films; acceptor-related emissions; bound exciton transitions; emission spectra; growth temperature; in-plane orientation; metal organic chemical vapor deposition; rocking curves half width; smooth surfaces; surface morphology; Chemical vapor deposition; MOCVD; Optical films; Organic chemicals; Rough surfaces; Substrates; Surface morphology; Surface roughness; Temperature; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2003. CLEO/Pacific Rim 2003. The 5th Pacific Rim Conference on
Print_ISBN :
0-7803-7766-4
Type :
conf
DOI :
10.1109/CLEOPR.2003.1277197
Filename :
1277197
Link To Document :
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