2684415

Relation between yield and reliability of integrated circuits and application to failure rate assessment and reduction in the one digit FIT and PPM reliability era

Van der Pol, J.A. ; Kuper, Fred G. ; Ooms, Eric R.

Philips Semiconductors

1996

1996

1603

1610

Application specific integrated circuits; BiCMOS integrated circuits; Bipolar integrated circuits; CMOS integrated circuits; CMOS technology; Circuit testing; Integrated circuit reliability; Integrated circuit yield; Jacobian matrices; Semiconductor device modeling;

English

ieee

Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on

0-7803-3369-1

conf

10.1109/ESREF.1996.888174

888174