Title :
Variable transmission lines: Structure and compact modeling
Author :
Shlafman, Shlomo ; Goren, David ; Sheinman, Benny ; Karni, Giora ; Valdes-Garcia, Alberto ; Elad, Danny
Author_Institution :
IBM Haifa R&D, Haifa, Israel
Abstract :
The concept of Variable Transmission Lines (VTL) offers digital tuning of transmission line characteristics to compensate for process variations and parasitic modeling uncertainties. VTL structures and models enabling robust silicon-based millimeter-wave IC design are proposed along with a compact model for their efficient simulation. The developed compact models have been successfully integrated into a standard silicon-foundry design kit to enable, for the first time, circuit-level simulations with parametric VTL. Several VTL evaluation structures have been fabricated in IBM 32nm CMOS SOI technology. Measurement results up to 65GHz are presented to evaluate the proposed structures and their models.
Keywords :
CMOS integrated circuits; MIMIC; elemental semiconductors; integrated circuit design; integrated circuit modelling; silicon; silicon-on-insulator; transmission lines; IBM CMOS SOI technology; Si; VTL; circuit-level simulation; digital tuning; parasitic modeling uncertainty; process variations compensation; silicon-based millimeter-wave IC design; size 32 nm; standard silicon-foundry design kit; variable transmission line; CMOS integrated circuits; Capacitance; Inductance; Integrated circuit modeling; Power transmission lines; Semiconductor device modeling; Transmission line measurements;
Conference_Titel :
Microwaves, Communications, Antennas and Electronics Systems (COMCAS), 2011 IEEE International Conference on
Conference_Location :
Tel Aviv
Print_ISBN :
978-1-4577-1692-8
DOI :
10.1109/COMCAS.2011.6105778
