DocumentCode

2684437

Title

AC effects in IC reliability

Author

Hu, Chenming

Author_Institution

University of California

fYear

1996

fDate

1996

Firstpage

1611

Lastpage

1617

Keywords

Circuit stability; Degradation; Digital circuits; Electric breakdown; Electromigration; Electrons; MOSFET circuits; Safety; Stress; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on

Print_ISBN

0-7803-3369-1

Type

conf

DOI

10.1109/ESREF.1996.888175

Filename

888175