DocumentCode
2684510
Title
A new analytic model for the description of the intrinsic oxide breakdown statistics of ultra-thin oxides
Author
Degreave, R. ; Roussel, Ph ; Groeseneken, G. ; Maes, H.E.
Author_Institution
IMEC
fYear
1996
fDate
1996
Firstpage
1639
Lastpage
1642
Keywords
Analytical models; Anodes; Cathodes; Degradation; Dielectric breakdown; Electric breakdown; Electron traps; Probability; Statistical analysis; Weibull distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN
0-7803-3369-1
Type
conf
DOI
10.1109/ESREF.1996.888180
Filename
888180
Link To Document