Title :
A new technique to characterize the early stages of electromigration-induced resistance changes at low current densities
Author :
D´Haeger, V. ; de Ceuninck, W. ; Knuyt, G. ; de Schepper, L. ; Stals, L.M.
Author_Institution :
Limburgs Universitair Centrum, Institute for Materials Research
Keywords :
Conductivity; Current density; Electrical resistance measurement; Electromigration; Inorganic materials; Monitoring; Physics; Temperature measurement; Temperature sensors; Testing;
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
DOI :
10.1109/ESREF.1996.888194
